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Comprehensive test of missile weapon system is an important guarantee technology in product development and use, and plays an increasingly important role in the life cycle of weapon system. Built-in Test(BIT) is one of the key methods to improve system testability, which is a kind of test technology for the internal self-test of equipment or system, so it is widely used in the field of missile test. This paper introduces the development status for the basic definition, characteristics, functions, the false alarm and its reducing strategies of BIT at home and abroad, and mainly focuses on the BIT cases in missile weapon systems. In view of the problems existing in the application of BIT in missile field, the possible ways to meet the testability requirements of new generation missiles in the future are discussed, and the development trend of in-flight testing technology in the future is discussed and prospected.