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In the process of data import, in order to solve the problem that the information test time is too long due to the large average compression ratio of semiconductor chip information, a semiconductor chip information test system platform based on embedded structure is designed. According to the layout of the embedded terminal system, the LeNet network model is established. On this basis, the execution process of the SMTExecutor structure is improved, and the tool set module design of the information test system platform is realized. Define Deflate mechanism and LZ4 mechanism respectively, combine data information parameters, standardize the execution mode of system platform synchronization thread, and realize the processing of semiconductor chip information. According to the embedded structure definition standard, the configuration file is generated, and the quantitative test conditions are planned by importing the key information, so as to identify the command words, realize the optimization of the test system function, and complete the design of the embedded structure semiconductor chip information test system platform by combining the tool set module. The experimental results show that the application of the above system platform can solve the problem that the average compression ratio of semiconductor chip information is too large in the process of data import, and can greatly shorten the information test time, which meets the actual application requirements.