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Based on the development of a domestic Very-large-scale Integration (VLSI) test system, we conducted a comprehensive test validation method research. According to the test verification targets of different stages, we have researched on some methods respectively from the test system instruments indicators test and verification stage, integrated circuit test and verification stage oriented to the system hardware and software functions and the test and verification stage based on the typical domestic VLSI. We had paid more attention to the specific test verification work, and further verified the feasibility of the proposed method. This method also provided an effective integrated test and verification idea for the new integrated circuit test system.