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基于典型集成電路的自動(dòng)測試演示驗證研究
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北京航天測控技術(shù)有限公司

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TP29

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Research on Automatic Test Demonstration and Verification Based on Domestic Very-large-scale Integration
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    摘要:

    當前國產(chǎn)超大規模集成電路測試設備由于技術(shù)指標、工作可靠性、制造成本等諸多因素,在國內尚未得到大規模的市場(chǎng)應用;從集成電路的測試需求出發(fā),給出了自研超大規模集成電路測試系統的總體架構組成,重點(diǎn)開(kāi)展了基于典型集成電路的自動(dòng)測試演示驗證方法研究,并以國產(chǎn)某型超大規模靜態(tài)存儲器芯片作為演示驗證的對象,利用自研測試系統完成了基于靜態(tài)存儲器芯片的自動(dòng)測試演示驗證試驗;試驗結果表明基于典型集成電路的自動(dòng)測試演示驗證方法和過(guò)程合理可行,能夠為國產(chǎn)新研超大規模集成電路測試系統推廣前的自動(dòng)測試演示驗證提供參考,同時(shí)可結合不同類(lèi)型集成電路的測試需求深入應用到各類(lèi)集成電路的測試過(guò)程。

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    At present, the homebred very-large-scale integration (VLSI) testing equipment has not been widely used in the domestic market due to many factors, such as technical specification, working reliability, manufacturing cost, etc. In this paper, the overall structure of the self-developed VLSI test system was given according to the test requirements of the integrated circuit. Meanwhile, this paper focused on the research of automatic test demonstration and verification method based on the typical IC. At last, a certain type of homemade very-large-scale static memory chip was taken as the test object of demonstration and verification, and the automatic verification test based on the static memory chip was completed by using the self-developed test system. The test results showed that the test method and process of automatic test demonstration and verification based on the typical IC was reasonable and feasible, and could provide a reference for the automatic test demonstration and verification before the popularization of the new homemade VLSI test system. Meanwhile the research content could be applied to the automatic test procedure of the other ICs deeply when combining the test requirements of different integrated circuits.

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閆麗琴,王占選,馮建呈,閆 靜,任朝旭.基于典型集成電路的自動(dòng)測試演示驗證研究計算機測量與控制[J].,2022,30(8):251-255.

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歷史
  • 收稿日期:2021-12-30
  • 最后修改日期:2022-03-01
  • 錄用日期:2022-03-02
  • 在線(xiàn)發(fā)布日期: 2022-08-25
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