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Due to the lack of analysis of the incident light source in the current phase delay measurement system, the corresponding translation error of different wavelength light sources is large, resulting in low phase delay measurement accuracy. A high-precision phase delay measurement system based on fiber multi wavelength laser is designed. By analyzing the cause of fiber scattering, 532nm semiconductor laser is selected as the system light source, servo motor is used to supply power for the system, and SGX5528 photodetector is used to realize the conversion of light into electricity, so as to obtain the potential difference between different positions. The polarizer is made of polyvinyl alcohol (PVA) film to make the incident longitudinal light or transverse light have polarization characteristics. The transmission direction and transverse axis angle of the polarizer are measured to complete the hardware design of the system. Set two laser light sources, adjust the polarizing prism to make the light intensity output reach the maximum value, and use the direct measurement method to calculate the phase delay of the wave plate to be measured. By adjusting the crystal axis orientation of the electro-optic modulator, ensure that the beam is perpendicular to the surface of the device, complete the system software design, and realize the high-precision measurement of the phase delay. The experimental results show that the translation errors of the system at L0, L1 and L2 are 0.008 mm, 0.0071 mm and 0.002 mm respectively, which are less than the ideal allowable error, and can effectively improve the phase delay measurement accuracy.