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In order to improve the accuracy of evaluating the single event transient (SET) of integrated circuits using static random access memory (SRAM) field programmable gate array (FPGA),.Research has been carried out in FPGA about the generation of transient pulses and the propagation characteristics of transient pulses. A method of transient pulse generation and measurement based on IDELAY2 delay element is proposed, which can continuously generate and measure positive pulses (0-1-0) and negative pulses (1-0-1) with a width increment of 78 ps. At the same time, 8 different logic circuits of gate circuits are implemented in the FPGA to study their influence on the transient pulse width. The experimental results show that the transient pulse generation and measurement method is simple to implement, the width of the injected pulse can be changed without changing the circuit layout, and the error between the calculated theoretical pulse width and the actual measurement is less than 7%. At the same time, the effect of 8 different gate logic chains on the transient pulse width is related to the gate type and pulse type, and has nothing to do with the initial input transient pulse width.