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As the improvement of chip operating speed, so it is high time to consider and take some measures to solve the problem. A test-generation method based on multiple crosstalk-induced glitch fault model is proposed. In this method ,it discusses Boolean satisfiability problem and analyse the crosstalk path delay fault model as well as Seven value logic of test vectors. It also analyse the mathematical logical expression converted by the crosstalk path delay fault model. And simplified CNF expression under the condition of non robust test,then a SAT-ATPG test algorithm of crosstalk delay fault is proposed.Finally,the algorithm is verified by specific example and the performance of the algorithm is effective for crosstalk-induced delay faults.