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The Test process is an important link in the product development cycle,however,there has been the lack of effective management,throughout the testing phase,there exists a lot of artificial,repetitive work which lead to low test efficiency.For the purpose of improve efficiency,an advanced test solution is put forward based on PXIe data acquisition system by hardware,LabVIEW and DIAdem by software:LabVIEW takes control of high speed synchronous data acquisition;DIAdem calls the data analysis function compiled by LabVIEW to accomplish the integration of data acquisition、data playback、data analysis、report generation and the automation of links above.In this paper,the C919 power supply test system is introduced to describe the solution,the test results show that,in the case data throughput is greater than 200M/s,this solution improves test efficiency、system scalability、system maintainability greatly,while accuracy is guaranteed.