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The probe system is always supposed to detect from the first grain of the wafer without manual alignment after wafer upload. However, the first position below the probe is often not ideal. In order to make the first grain below the probe quickly, spiral localization algorithm is coming out. The unique special grain of the wafer should be found first. The platform is treating the first position as the center and step moving spirally, the search range is extending step by step until find the special grain. Since the location of the first grain and the special grain is relatively fixed, so the first grain can be easily found after special grain. This method has carried on the experiment many times after integrate programmed. Now the whole system has already consigned to usage, the movements work well and stably, special grain can be found very quickly. After all, this automatic locating method not only saves labor costs, to improve the positioning accuracy, and greatly improve the efficiency of the probe system. 