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With the increasing complexity of the new generation electron productions, the testability of circuits and systems decreases sharply. Traditional technology cannot meet the requirements of tests, so it has raised challenge in the failure diagnosis and maintenance of electronics-equipped device. Considered the need of testability of electronics, the IEEE1149 standards’ characteristics, elements, purpose and relationship is researched; and also the viability and applicability of IEEE1149 standards’ in electronic equipment testability design is analyzed, and the way to apply boundary-scan technology in testability design is discovered. The basis and reference to the national application of boundary-scan test technology in electronic equipment. Boundary-Scan test technology can solve the traditional testability design problem effectively, playing an important role in improving diagnosis ability, shortening product manufacture cycle and research cost.