基于邊界掃描技術(shù)的測試性?xún)?yōu)化方法研究

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基于邊界掃描技術(shù)的測試性?xún)?yōu)化方法研究
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作者單位:(1.裝甲兵工程學(xué)院 控制工程系,北京 100072;2.裝甲兵工程學(xué)院 外訓系,北京 100072) 
作者簡(jiǎn)介:劉磊峰(1984),男,江蘇沛縣人,碩士研究生,主要從事檢測技術(shù)與自動(dòng)化裝置方向的研究。 謝永成(1964),男,博士,教授,主要從事裝甲車(chē)輛電氣系統檢測與診斷技術(shù)方向的研究。
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Study of Testability Optimization Method Based on Boundary Scan Technology

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(1. Department of Control Engineering,Academy of Armored Forced Engineering,Beijing 100072,China ;;2.Department of Foreign Training, Academy of Armored Forced Engineering, Beijing 100072,China)

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摘要:

針對基于邊界掃描測試技術(shù)對集成電路測試復雜的問(wèn)題,提出了貪婪算法和圖的色素理論算法；貪婪算法是指在測試網(wǎng)絡(luò )與器件之間建立一個(gè)矩陣模型,通過(guò)局部最優(yōu)解來(lái)尋找全局最優(yōu)解的一種算法；圖的色素理論是借助圖的色數理論和技術(shù),通過(guò)圖形繪制網(wǎng)絡(luò )與器件的關(guān)系,從中尋找最少著(zhù)色方案的一種算法；實(shí)驗結果表明,貪婪算法和圖的色素理論兩種算法的應用都能夠較好地解決電路板測試性復雜性和測試性完備性問(wèn)題,具有很強的實(shí)用性,可用于復雜數字電路板測試。

Abstract:

Established a greed algorithm and a pigment of graph theory algorithm which can solve the problem of integrated circuit based on boundary scan. Greed algorithm means to establish a matrix model between test network and components, and find a global optimal solution by local optimal solution through the matrix. The pigment of graph theory algorithm means to use the theory and technology of pigment of graph, to find a minimum of coloring algorithm by drawing a relationship between network and components through the graph It was proved that the greed algorithm and the pigment of graph theory algorithm were the good solution to solve the test complexity and the test completeness of the circuit board. And these two algorithms were so practical that can be used in complex digital circuit test.

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劉磊峰,謝永成,李光升,魏寧.基于邊界掃描技術(shù)的測試性?xún)?yōu)化方法研究計算機測量與控制[J].,2015,23(8):2607-2609, 2613.

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收稿日期:2014-09-20
最后修改日期:2014-12-03
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在線(xiàn)發(fā)布日期: 2015-10-08
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