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Boundary-scan test is a main method for fault isolation of digital circuit modules. But it is restricted by the design for test of modules,and ignored on other sides for itself capability. The article puts forward a set of methods to design the digital circuit ATE system for Boundary-scan test,including self test for system,function test for modules and fault isolation for modules. Boundary-scan could enhance the precision for fault isolation for being applied in the self test for system. It is a new selection for module function test. And it would break the restriction of design for test of modules,and improve the fault coverage and the precision for fault isolation by the design of extensibility for boundary-scan. Through the carried out experiments,the design methods is stable and reliable,and it enhances both ATE system and the module test ability and the precision for isolation.