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In order to achieve the rational allocation of testability index, the secondary linear interpolation method for testability allocation was proposed, considering the mainstream technology of the testability, and analyzing the main factors affecting the testability allocation. Using the testability modeling concept, firstly, the mapping relationship between the LRU and function attributes can be obtained by using the system partition transverse and longitudinal, and the LRU was clustered, the testability index was distributed for the first time according to the clustering results, namely the index was assigned to function attributes; And then, at the range of the function attributes, considering the characteristic parameters, such as the LRU failure rate, test, and fault diffusion intensity, on the second distribution of interpolation. Finally, the method has been verified with a practical example, the results show that the allocation process is simple and believable, results without correction, conforms to the actual requirements. the proposed method has break the traditional indicators, which can realized the testability allocation of the system level to the LRU level using secondary linear interpolation.