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In recent years, with the development of DSP, FPGA and other VLSI, the performance of electronic systems is greatly increasing. However, they also brought a new problem of testing and fault diagnosis at the same time. For solving the problem of fast diagnosis and maintenance on circuit board, the embedded test has becoming a research topics. Based on it, the embedded boundary-scan technology and the non-incursive board test technology are introduced firstly. Then the difficulty of the analog BIST(built-in self test) and its fundamental principle are illustrated. And an embedded controller solution based on FPGA is given. The embedded DFT targeted at the key function circuits of the digital IO board is presented, the test program development and download are described in brief. Based on the prepared test results, the embedded DFT is used to further enhance the test automation and the test efficiency. It can decrease the life cycle cost of test and maintenance greatly.